The system is designed to measure the optical, electrical parameters, characteristics of the radiating sources, different displays, lighting panels and LEDs. Flexible hardware and software configuration supports highly automated measurements, analysis, temperature control and monitoring, comparability with and external optical measuring devices (radiometers, spectrometers, etc.) and different diameter of spheres.

The system is based on the NI PXI platform and uses software developed in the NI LabVIEW graphical programming environment.

Measurement types :

1. Temperature: electrical and optical parameters dependency from temperature.
2. Optical: color, spectrum and spatial radiation pattern, efficiency and radiated intensity, etc.
3. Electrical: IV characteristics (forward, reverse), pulsed sweep current measurement.

Details :

• Author : yeatAdmin
• Category : Electronic Components Test Systems
• Date : September 15, 2016