The system is designed to test audio path, memory and accumulator parameters of recording devices. It is based on the NI PXI platform and uses software developed in the NI LabVIEW graphical programming environment. The system is universal for all types of audio recording devices and can test simultaneously five devices.
Measurements :
- Frequency response test
- Signal-to-noise ratio test
- Total harmonic distortion test
- Dynamic range test
- Relative-phase angle test
- Crosstalk test
- Intermodulation distortion test
- Test in acoustic chamber
- Accumulator test
- Memory test
Details :
- Author : yeatAdmin
- Category : Audio/Video Device Test Systems
- Date : September 15, 2016